Multiwavelength emission characterization of nanoparticles by means of a novel analytical ultracentrifuge

Multiwavelength emission characterization of nanoparticles by means of a novel analytical ultracentrifuge

 

Particle properties depend on dispersity (particle size, shape, surface and inner structure) and composition. In order to fully exploit these property functions in technical applications, comprehensive multi-dimensional characterization methods are required. Developments in recent years in the field of analytical ultracentrifugation with integrated multi-wavelength absorption optics have already demonstrated the unmatched resolution, accuracy and reproducibility of size, shape, density and spectral absorption property characterization. Objective of this project is the development of a novel emission detector within an analytical ultracentrifuge. The separation of the particles during sedimentation allows the determination of dispersity-dependent (e.g. size, shape, density) emission properties. The new method is applicable for quantum dots, new 2D materials and proteins and their aggregates.

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